SAP TQDEFCCATSTTGS Table in S/4 HANA - Defect Category Settings
TQDEFCCATSTTGS is a standard SAP Table which is used to store Defect Category Settings data and is available within S/4 HANA SAP systems depending on the version and release level. Below is the technical details and the list of fields specifically relevant for an SAP S/4 HANA system
Even using an S/4 Hana system you can still view further information about the SAP TQDEFCCATSTTGS table and the data within it using standard SAP GUI transactions such as SE11, SE80 or SE16. Or you can use the ADT (ABAP development tools within eclipse).
Delivery Class: C - Customising table, maintenance only by cust
Display/Maintenance via SM30: Display/Maintenance Allowed but with Restrictions
Enhancement category: Can be enhanced (character-type)
Dictionary Type: Transparent table
Database Table: TQDEFCCATSTTGS
TQDEFCCATSTTGS table structure field list
Below is the full TQDEFCCATSTTGS field list that makes up the SAP database table structure, including key fields, description, data type and other technical details of each field
| Field | Description | Data Element | Data Type | length (Dec) | Check table | Conversion Routine | Domain Name | MemoryID | SHLP | SHLP Field |
| CLIENT | Client | MANDT | CLNT | 3(0) | MANDT | |||||
| CATEGORY | Defect Category | QDEFCCATEGORY | CHAR | 2(0) | TQDEFCCAT | QDEFCCATEGORY | ||||
| ORIGIN | Defect Category Origin | QDEFCCATEGORYORIGIN | CHAR | 1(0) | QDEFCCATEGORYORIGIN | |||||
| DEFAULT_TASKTYPE | Default Task Type | QDEFCAT_DEFAULT_TASKTYPE | CHAR | 2(0) | TQSTASKTYPE | QTSKTYPE | ||||
| MATNR_ANLYTS_RELEVANT | Material Is Relevant for Defect Analytics | QDEF_MATNR_ANLYTS_RELEVANT | CHAR | 1(0) | XFLAG | |||||
| WERKS_ANLYTS_RELEVANT | Plant Is Relevant for Defect Analytics | QDEF_WERKS_ANLYTS_RELEVANT | CHAR | 1(0) | XFLAG | |||||
| PRUEFLOS_ANLYTS_RELEVANT | Inspection Lot Is Relevant for Defect Analytics | QDEF_PRUEFLOS_ANLYTS_RELEVANT | CHAR | 1(0) | XFLAG | |||||
| PNLKN_ANLYTS_RELEVANT | Inspection Operation Is Relevant for Defect Analytics | QDEF_PNLKN_ANLYTS_RELEVANT | CHAR | 1(0) | XFLAG | |||||
| MERKNR_ANLYTS_RELEVANT | Inspection Characteristic Is Relevant for Defect Analytics | QDEF_MERKNR_ANLYTS_RELEVANT | CHAR | 1(0) | XFLAG | |||||
| PROBENR_ANLYTS_RELEVANT | Inspection Sample Is Relevant for Defect Analytics | QDEF_PROBENR_ANLYTS_RELEVANT | CHAR | 1(0) | XFLAG | |||||
| ARBPL_ANLYTS_RELEVANT | Work Center Is Relevant for Defect Analytics | QDEF_ARBPL_ANLYTS_RELEVANT | CHAR | 1(0) | XFLAG | |||||
| ARBPLWERK_ANLYTS_RELEVANT | Work Center Plant Is Relevant for Defect Analytics | QDEF_ARBPLWERK_ANLYTS_RELEVANT | CHAR | 1(0) | XFLAG |
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